Jenoptik has patented a method for testing optoelectronic chips on a wafer, involving precise alignment of electrical and optical interfaces. The method utilizes a positioning table and contacting module to ensure optimal contact and alignment, enabling efficient testing of the chips. GlobalData’s report on Jenoptik gives a 360-degree view of the company including its patenting strategy. Buy the report here.

According to GlobalData’s company profile on Jenoptik, Lidar for weather forecasting was a key innovation area identified from patents. Jenoptik's grant share as of April 2024 was 39%. Grant share is based on the ratio of number of grants to total number of patents.

Testing method for optoelectronic chips on a wafer

Source: United States Patent and Trademark Office (USPTO). Credit: Jenoptik AG

A recently granted patent (Publication Number: US11906579B2) outlines a method for testing optoelectronic chips on a wafer, featuring a unique approach to aligning optical deflection elements with optical interfaces. The method involves a positioning table that can be adjusted in multiple directions and rotated, allowing for precise alignment of electrical and optical interfaces. By feeding the wafer to a contacting module and aligning the optical deflection elements with the optical interfaces, the method ensures proper routing of electrical and optical signals between the interfaces. The alignment process involves deflecting the positioning table in the X and Y directions to achieve optimal coupling of optical signals, followed by adjusting the chips in the X-Y direction based on the coupling angle of the optical deflection element.

Furthermore, the patent describes additional features of the method, such as storing position differences as offsets for adjusting further chips, monitoring the optical working distance for changes in pressing force, and replacing needles when the optical working distance decreases. The method also addresses issues related to over-radiation and radiation intensity distribution of optical signals when coupled into the interfaces. These innovative techniques aim to enhance the testing process for optoelectronic chips on a wafer, ensuring accurate alignment and signal routing for efficient testing and quality control.

To know more about GlobalData’s detailed insights on Jenoptik, buy the report here.

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GlobalData Patent Analytics tracks bibliographic data, legal events data, point in time patent ownerships, and backward and forward citations from global patenting offices. Textual analysis and official patent classifications are used to group patents into key thematic areas and link them to specific companies across the world’s largest industries.