Onto Innovation. has been granted a patent for a method that utilizes an effective cell approximation to analyze standard logic cells. This method involves producing light, measuring its reflection from a sample, and comparing data to determine characteristics of the logic cell based on its density of lines and spaces. GlobalData’s report on Onto Innovation gives a 360-degree view of the company including its patenting strategy. Buy the report here.

According to GlobalData’s company profile on Onto Innovation, Defect detection models was a key innovation area identified from patents. Onto Innovation's grant share as of June 2024 was 59%. Grant share is based on the ratio of number of grants to total number of patents.

Method for measuring characteristics of standard logic cells