Tektronix has developed a system for data creation, storage, and analysis during margin testing. The patented technology includes a margin test generator, data repository, and comparator to determine if test results match predictive outcomes based on previous tests. The system aims to improve testing efficiency and accuracy. GlobalData’s report on Tektronix gives a 360-degree view of the company including its patenting strategy. Buy the report here.

According to GlobalData’s company profile on Tektronix, was a key innovation area identified from patents. Tektronix's grant share as of February 2024 was 71%. Grant share is based on the ratio of number of grants to total number of patents.

System for margin testing and predictive outcome matching

Source: United States Patent and Trademark Office (USPTO). Credit: Tektronix Inc

A recently granted patent (Publication Number: US11927627B2) discloses a test device designed to efficiently test devices under test (DUT) during various testing states of a test session. The device includes a test interface to connect to the DUT, controllers to generate margin test signals, a data repository to store testing results along with DUT identifiers, and a user interface to display indications of matching results with predictive outcomes. The predictive outcomes are based on an analysis of previous testing results of the DUT and other devices, as well as data on operational lifetimes. The device aims to enhance testing accuracy and predict the operational life of the DUT based on testing outcomes.

Moreover, the patent also describes a method of operating the test device, which involves generating test signals, storing testing results in a library, determining matches with predictive outcomes, and producing indications for users. The method emphasizes the importance of storing DUT identifiers along with relevant testing data in the library for future reference. Additionally, the method includes steps for generating and using predictive outcomes by analyzing past test results, comparing them with present results, and predicting the incidence of failure of the DUT. The method aims to streamline the testing process, improve efficiency, and provide valuable insights into the longevity and performance of the DUT based on historical data and predictive analysis.

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