Teradyne‘s patented test system features pickers, sockets, and a gantry for testing devices under test (DUTs). The system includes LASER range finders and a 3D camera for precise positioning and control during testing. This innovative technology enhances accuracy and efficiency in device testing processes. GlobalData’s report on Teradyne gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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According to GlobalData’s company profile on Teradyne, Robot path planning was a key innovation area identified from patents. Teradyne's grant share as of January 2024 was 54%. Grant share is based on the ratio of number of grants to total number of patents.
Automated test system with pickers, gantry, and 3d camera
A recently granted patent (Publication Number: US11867749B2) describes a test system designed for testing devices under test (DUTs) with advanced features. The system includes test sites with sockets for DUTs, pickers for handling the DUTs, a gantry for picker movement, and a 3D camera for capturing images of the sockets or DUTs. The camera, controlled by a servo system, aids in placing or picking DUTs. Additionally, the system incorporates LASER range finders to detect distances to DUTs in sockets, enabling precise positioning. The control system utilizes this data to ensure proper placement of DUTs and even determines whether to place a lid over the socket based on DUT positioning.
Furthermore, the test system includes scanners for capturing 3D data of sockets and trays holding DUTs, allowing the control system to determine locations, orientations, and structures for accurate testing. The system's precision extends to microns, ensuring high-quality testing. The patent also details the use of strobe lights and cameras to capture images of pickers holding DUTs, aiding in determining DUT positions and orientations relative to sockets. The innovative features of this test system offer enhanced accuracy and efficiency in testing processes, making it a valuable addition to the field of device testing technology.
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