Aehr Test Systems has been granted a patent for an apparatus designed for burn-in and functional testing of microelectronic circuits on unsingulated wafers. The system features a cartridge for electric path fanning, a distribution board with strategically positioned interfaces, and a piston for precise force control on wafer contacts. GlobalData’s report on Aehr Test Systems gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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According to GlobalData’s company profile on Aehr Test Systems, 3D memory devices was a key innovation area identified from patents. Aehr Test Systems's grant share as of January 2024 was 60%. Grant share is based on the ratio of number of grants to total number of patents.
Apparatus for testing integrated circuits of devices
The granted patent (Publication Number: US11860221B2) discloses an apparatus designed for testing integrated circuits of devices. The apparatus includes a frame, a holder for the device secured to the frame, and a contactor support structure also held by the frame. The contactor support structure features a plurality of terminals for contacting the device's contacts, along with interfaces with rows of contacts for connecting to connectors. The apparatus allows for movement between the holder and contactor support structure to establish contact between the terminals and device contacts. Additionally, the apparatus includes a power source, power electrical path, and a signal source for testing purposes.
Furthermore, the patent claims detail various configurations and features of the apparatus, such as the angle between the rows of contacts in the interfaces, the inclusion of multiple interfaces, and the specific layout of the contactor support structure. The apparatus is designed to efficiently test integrated circuits by providing a reliable connection between the device under test and the testing equipment. The use of multiple interfaces and terminals enhances the functionality and versatility of the apparatus, allowing for comprehensive testing of various types of integrated circuits. Additionally, the design of the contactor support structure ensures secure connections and efficient testing processes. Overall, the patented apparatus offers a sophisticated solution for testing integrated circuits in devices, with a focus on accuracy and reliability in the testing procedures.
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GlobalData Patent Analytics tracks bibliographic data, legal events data, point in time patent ownerships, and backward and forward citations from global patenting offices. Textual analysis and official patent classifications are used to group patents into key thematic areas and link them to specific companies across the world’s largest industries.
