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Jenoptik gets grant for method for testing optoelectronic chips on wafer with specific alignment
Jenoptik has patented a method for testing optoelectronic chips on a wafer, involving precise alignment of electrical and optical interfaces....
Jenoptik files patent for method for controlling laser processing process on workpiece surface
Jenoptik has filed a patent for a method to control laser processing on a workpiece surface. The method involves using...
Jenoptik gets grant for mtf testing apparatus with telescopic cameras for lens field positions
Jenoptik has developed an MTF testing apparatus with telescopic cameras mounted on a camera holder to capture images projected by...
Jenoptik files patent for a contacting module for optical and electronic interfaces
Jenoptik has filed a patent for a contacting module and method for assembling it with an optical module and an...