EXFO‘s patent involves methods and systems for testing optical fiber link continuity using backscattering patterns as signatures. The OTDR method detects fluctuations in the receive fiber structure to determine link continuity. This innovation allows for efficient testing of various optical devices. GlobalData’s report on EXFO gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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According to GlobalData’s company profile on EXFO, AI-assisted repair estimation was a key innovation area identified from patents. EXFO's grant share as of January 2024 was 66%. Grant share is based on the ratio of number of grants to total number of patents.
Optical fiber link continuity testing using backscattering pattern signature
A recently granted patent (Publication Number: US11879802B2) discloses an Optical Time Domain Reflectometer (OTDR) method for testing fiber link continuity in optical fiber networks. The method involves receiving backscattering patterns obtained from pre-characterization of receive fibers, performing OTDR acquisitions to obtain OTDR traces representing backscattered and reflected light, and searching for specific backscattering patterns in the OTDR traces to determine link continuity. The backscattering patterns act as signatures to recognize specific fibers within the network, enabling accurate testing and identification of fiber links.
Furthermore, the patent also describes an OTDR method for testing fiber link continuity in multi-fiber and multi-port devices. By utilizing sets of backscattering patterns as signatures for receive fibers, the method allows for the determination of link continuity in complex network configurations. The use of correlation coefficients and threshold comparisons enhances the accuracy of matching receive fibers in OTDR traces, ensuring reliable testing and identification of optical fiber links within multi-fiber and multi-port devices. The patent also details the use of polarization scrambling during testing and the recording of backscattering patterns for various environmental conditions, such as different temperatures or laser center wavelengths, to improve the robustness of the testing method.
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