National Instruments has been granted a patent for a reflectometer design that includes two directional couplers in a parallel configuration, resulting in reduced size and signal loss compared to reflectometers with a serial configuration. This design improves the output power and dynamic range of vector network analyzer (VNA) systems. GlobalData’s report on National Instruments gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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According to GlobalData’s company profile on National Instruments, Digital twins was a key innovation area identified from patents. National Instruments's grant share as of September 2023 was 80%. Grant share is based on the ratio of number of grants to total number of patents.
Reflectometer with parallel directional couplers for reduced size and signal loss
A recently granted patent (Publication Number: US11774475B2) describes a reflectometer and measurement system for use in vector network analyzers. The reflectometer includes a first port and a second port, as well as a first directional coupler and a second directional coupler. These directional couplers are positioned across from each other on opposite sides of a signal line, allowing them to share a section of the signal line. The first directional coupler couples a portion of signal power from the first end of the signal line to the second port, while the second directional coupler couples a portion of signal power from the second end of the signal line to the first port. The physical length of the reflectometer is one-half of the wavelength of the lowest operating corner frequency.
The reflectometer also includes a third port and a fourth port, each with a termination that minimizes reflections. The first and second ports can be configured to couple to respective receivers. The reflectometer, along with the first and second directional couplers, can be implemented on a printed circuit board, with the components of the directional couplers configured on different circuit layers.
The measurement system, which incorporates the reflectometer, includes a signal line that connects a signal port to a test port. The first and second directional couplers are positioned across from each other on opposite sides of the signal line to share a section of the line. The first directional coupler couples signal power from the signal port to the test port, while the second directional coupler couples signal power from the test port to the signal port. The physical length of the shared section of the signal line is one-half of the wavelength of the operating corner frequency of the reflectometer.
The measurement system can also include a third port connected to the first port via a first line, and a fourth port connected to the second port via a second line. These ports are terminated with the characteristic impedance of the measurement system. The first and second ports can be coupled to respective receivers.
The patent also describes a vector network analyzer (VNA) system that includes one or more signal ports, one or more test ports, and one or more reflectometers. Each reflectometer corresponds to a signal line and includes a first port, a second port, and first and second directional couplers. The physical length of each reflectometer is one-half of the wavelength of the lowest operating corner frequency.
Overall, this patent describes a reflectometer and measurement system that can be used in vector network analyzers, providing accurate and efficient signal power coupling and minimizing reflections. The use of directional couplers and the specific physical length of the reflectometer contribute to its effectiveness.
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GlobalData Patent Analytics tracks bibliographic data, legal events data, point in time patent ownerships, and backward and forward citations from global patenting offices. Textual analysis and official patent classifications are used to group patents into key thematic areas and link them to specific companies across the world’s largest industries.
