Chunghwa Telecom has filed a patent for a vertical probe card and fence-like probe. The probe has a length of 5 mm to 8 mm and includes a fence-like segment with a penetrating slot, a ceramic layer covering the slot, and connection and testing segments. The patent claims a vertical probe card with staggered guiding board units, where the fence-like segments of the probes bend in the same direction. GlobalData’s report on Chunghwa Telecom gives a 360-degree view of the company including its patenting strategy. Buy the report here.
According to GlobalData’s company profile on Chunghwa Telecom, AI for workflow management was a key innovation area identified from patents. Chunghwa Telecom's grant share as of September 2023 was 73%. Grant share is based on the ratio of number of grants to total number of patents.
Vertical probe card with fence-like probes for testing circuits

A recently filed patent (Publication Number: US20230314478A1) describes a vertical probe card used in electronic testing. The probe card consists of two guiding board units and multiple fence-like probes that pass through these units. Each fence-like probe has a probe length ranging from 5 mm to 8 mm and includes a fence-like segment with a penetrating slot. The fence-like segment is covered by a ceramic layer, except in the guiding board units. The probe card is designed in such a way that when the guiding board units are staggered, the fence-like segments of the probes bend elastically in the same direction.
In addition to the above, the patent also describes various features of the fence-like probes. The ceramic layer extends from the middle of the fence-like segment towards the connection and testing segments, with at least 50% of the fence-like segment embedded in the ceramic layer. The penetrating slot of each probe is fully filled and embedded in the ceramic layer. The fence-like segment of each probe consists of two arms and at least one inner arm, all of which are embedded in the ceramic layer. The cross-sections of the two arms have the same area, which is different from the area of the inner arm's cross-section. The ceramic layer of each conductive probe is tested and meets at least class 3B under the ASTM standard.
Furthermore, the fence-like segment of each probe has a first protrusion that extends from one of the long walls of the penetrating slot, spaced apart from the other long wall by a gap. The penetrating slot and the first protrusion are fully embedded in the ceramic layer. When the guiding board units are staggered, one of the long walls extends to form the first protrusion on the outer side of the other long wall.
The patent also includes a claim for a fence-like probe as a separate invention. This probe has a probe length within the range of 5 mm to 8 mm and includes a fence-like segment with a penetrating slot. The fence-like segment is covered by a ceramic layer, except for the connection and testing segments.
Overall, this patent describes a vertical probe card with fence-like probes that have specific design features, including a ceramic layer covering the fence-like segment and a unique arrangement that allows for elastic bending in the same direction. These features aim to improve the performance and reliability of electronic testing using vertical probe cards.
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