Infineon Technologies had 126 patents in future of work during Q2 2024. Infineon Technologies AG filed patents in Q2 2024 related to integrated circuits with lateral field effect transistors, current sense circuitry for power transistors, current limitation concepts for intelligent semiconductor switches, GaN dies with current sense terminals, and co-packaged controlled overcurrent handling for power switch assemblies. These patents focus on improving efficiency, control, and protection in semiconductor devices. GlobalData’s report on Infineon Technologies gives a 360-degree view of the company including its patenting strategy. Buy the report here.
Infineon Technologies had no grants in future of work as a theme in Q2 2024.
Recent Patents
Application: Controlled switching of stress voltages in lateral dmos structures (Patent ID: US20240210467A1)
The patent filed by Infineon Technologies AG describes an integrated circuit with a lateral field effect transistor and a field plate electrode isolated by an isolation zone. The circuit includes a first terminal for applying a test voltage, an electronic switch to connect the field plate electrode to a reference voltage node, and a second terminal for controlling the switch. The isolation zone can be formed by shallow trench isolation or an oxide layer. The circuit can include additional transistors and switches for more complex configurations.
The system also includes an automatic test equipment (ATE) for testing the integrated circuit in a test operating mode by applying the test voltage to the field plate electrode while the electronic switch is open. The ATE can measure leakage current through the field plate electrode during testing. The method of testing the integrated circuit involves applying the test voltage while the switch is open to disconnect the field plate electrode from the circuit node and measuring the leakage current. Additional steps include controlling the switch with a control signal and measuring leakage current during testing. Overall, the patent describes a comprehensive system and method for testing integrated circuits with lateral field effect transistors.
To know more about GlobalData’s detailed insights on Infineon Technologies, buy the report here.
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