Teledyne Technologies has filed a patent for an X-ray detecting system that includes a pixel array and readout circuitry for acquiring multiple frames related to a single X-ray exposure. The system also includes a processing unit with a frame summing unit and an X-ray image generating unit. The frame summing unit compares the pixel values of the acquired frames to detect any adversely affected values caused by direct hits from X-ray photons. The X-ray image generating unit then generates an X-ray image based on the remaining pixel values. GlobalData’s report on Teledyne Technologies gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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According to GlobalData’s company profile on Teledyne Technologies, Photovoltaic drones was a key innovation area identified from patents. Teledyne Technologies's grant share as of September 2023 was 66%. Grant share is based on the ratio of number of grants to total number of patents.
X-ray detecting system with improved pixel value processing
A recently filed patent (Publication Number: US20230314638A1) describes an X-ray detecting system that includes an X-ray detector with a pixel array and readout circuitry, as well as a processing unit. The readout circuitry is designed to acquire multiple frames related to a single X-ray exposure, each containing pixel values for the pixels in the array. The processing unit consists of a frame summing unit and an X-ray image generating unit. The frame summing unit compares the pixel values of the acquired frames for each pixel to detect any values that were adversely affected by a direct hit from an X-ray photon. It then generates a pixel value for that pixel based on the other acquired frames, discarding the adversely affected value. The X-ray image generating unit uses the generated pixel values to create an X-ray image.
The patent also mentions that the X-ray detecting system does not include a fiber optic plate. The frame summing unit can detect the adversely affected pixel value by determining the median or average value of the acquired frames for each pixel and identifying values that deviate beyond a certain threshold. The pixel array in the X-ray detector consists of active pixels, which can have a 3T or 4T layout. The pixel array is a CMOS pixel array on a Silicon substrate. The system also includes a carrier, a scintillator, and a semiconductor substrate where the pixel array and readout circuitry are integrated.
The patent further describes an X-ray system that includes the aforementioned X-ray detecting system and an X-ray source. The pixels in the pixel array are active pixels with storage capacity. The X-ray system can operate in a mode where the X-ray source emits X-rays with a dose rate between 0.01 and 10 mGy in a single exposure. The integration time of the pixel array ensures that the storage capacity remains between 1 and 50 percent during the exposure, and the number of acquired frames exceeds 4.
Additionally, the patent outlines an X-ray detection method that involves emitting X-rays to an object, converting the passed-through X-rays into visible light, and detecting the visible light using a pixel array. Multiple frames are acquired during a single X-ray exposure, and the pixel values of these frames are compared for each pixel to identify any adversely affected values caused by direct hits from X-ray photons. The method generates a pixel value for each pixel based on the other acquired frames, discarding the adversely affected value. Finally, an X-ray image is generated using the generated pixel values.
Overall, this patent presents an X-ray detecting system and method that can effectively process pixel signals to generate high-quality X-ray images, while also detecting and discarding adversely affected pixel values caused by direct hits from X-ray photons.
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