Microsemi has patented a burn-in board for testing semiconductor devices. The board includes a strip socket with heating blocks, conductive contacts for monitoring devices, and heating control circuitry. This innovation allows for selective monitoring of individual devices during the burn-in test process. GlobalData’s report on Microsemi gives a 360-degree view of the company including its patenting strategy. Buy the report here.
Smarter leaders trust GlobalData
Access deeper industry intelligence
Experience unmatched clarity with a single platform that combines unique data, AI, and human expertise.
According to GlobalData’s company profile on Microsemi, was a key innovation area identified from patents. Microsemi's grant share as of February 2024 was 95%. Grant share is based on the ratio of number of grants to total number of patents.
Burn-in board for testing semiconductor devices with heating control
A recently granted patent (Publication Number: US11913989B2) discloses a burn-in board designed for burn-in testing of devices. The board includes a printed circuit board (PCB) with a strip socket mounted to it, featuring a socket base for receiving a device strip with an array of devices. The strip socket also includes a socket lid with at least one integrated heating block for temperature control. Conductive contacts are provided to interact with individual devices on the device strip. Additionally, the board incorporates heating control circuitry and burn-in test circuitry for inputting and outputting test signals to and from the devices, respectively.
Furthermore, the patent details the design of the strip socket, highlighting features such as a contactor plate on the socket base with device contact holes, allowing conductive contacts to make contact with individual devices. The board is equipped with multiple heating blocks for independent temperature control of different device panels on the device strip. The system also includes a multiplexer system for monitoring device performance signals and power signals. The patent also covers a system for burn-in testing of devices, comprising a burn-in test machine and a burn-in board with similar functionalities as described above, emphasizing the importance of efficient testing procedures in the electronics industry.
To know more about GlobalData’s detailed insights on Microsemi, buy the report here.
Data Insights
From
The gold standard of business intelligence.
Blending expert knowledge with cutting-edge technology, GlobalData’s unrivalled proprietary data will enable you to decode what’s happening in your market. You can make better informed decisions and gain a future-proof advantage over your competitors.
GlobalData, the leading provider of industry intelligence, provided the underlying data, research, and analysis used to produce this article.
GlobalData Patent Analytics tracks bibliographic data, legal events data, point in time patent ownerships, and backward and forward citations from global patenting offices. Textual analysis and official patent classifications are used to group patents into key thematic areas and link them to specific companies across the world’s largest industries.
