Data Insights
Showing 4 results out of 4
National Instruments gets grant for system for sorting electronic devices based on test data
National Instruments has patented a method and system for sorting electronic devices during testing. The technology involves receiving data from...
National Instruments gets grant for method to identify defects in electronic assemblies using grid nodes
National Instruments has patented a method for identifying defects in electronic assemblies using a grid of nodes to determine failed...
National Instruments files patent for reflectometer with parallel directional couplers for signal power measurement
National Instruments. has filed a patent for a reflectometer with two directional couplers placed parallel to each other on a...
National Instruments gets grant for reflectometer with parallel directional couplers for reduced size and signal loss
National Instruments has been granted a patent for a reflectometer design that includes two directional couplers in a parallel configuration,...