Advantest had 14 patents in future of work during Q1 2024. Advantest Corp has filed patents for a tester system with a high performance processor for fast testing of devices under test, a low power module for low power operation, and driver hardware for applying commands in low power. Another patent describes an automated test equipment with radio frequency ports for stimulus and measurement, and a loopback signal path. Additionally, Advantest Corp has developed testing systems with liquid cooled thermal arrays that pivot in three dimensions for improved thermal performance. Another patent involves a test apparatus with a tester interface board, sockets for devices under test, a carrier for DUTs to align with sockets, and socket covers to actuate DUTs. GlobalData’s report on Advantest gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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Advantest grant share with future of work as a theme is 57% in Q1 2024. Grant share is based on the ratio of number of grants to total number of patents.
Recent Patents
Application: Low power environment for high performance processor without low power mode (Patent ID: US20240094287A1)
The patent filed by Advantest Corp. describes a tester system that includes a test computer system and a hardware interface module for testing multiple devices under test (DUTs). The hardware interface module consists of a high-performance processor, a memory for storing instructions and data, and a low-power module for operating in low power mode. The high-performance processor controls the testing functionality at high speed, while the low-power module configures the DUTs into low power mode for testing. Additionally, driver hardware is used to apply commands and data in low power to the DUTs during testing.
The patent also includes claims related to the tester system, method of testing DUTs in low power mode, an electronic circuit with low power modes, an automated test equipment (ATE) system, and a computer-readable medium with instructions for testing DUTs in low power mode. These claims detail the components and processes involved in coordinating and controlling testing, configuring DUTs into low power mode, and generating test vectors for testing. The use of a high core count (HCC) processor, scalable core numbers, and specific low power modes like PCIe L1.1 and L1.2 are also mentioned in the claims, highlighting the versatility and adaptability of the testing system.
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