Micron Technology had two patents in social media during Q2 2024. The patent filed by Micron Technology Inc in Q2 2024 describes methods and apparatus for using characterized memories with a range of performances over operational parameters. These memories can be used with a solution density function to optimize memory searching, such as in cryptocurrency mining for generating memory hard proof-of-work. The validation mechanism ensures only valid solutions are broadcasted, with applications in blockchain, social media, machine learning, and other error-tolerant applications. GlobalData’s report on Micron Technology gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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Micron Technology had no grants in social media as a theme in Q2 2024.
Recent Patents
Application: Methods and apparatus for characterizing memory devices (Patent ID: US20240160270A1)
The patent filed by Micron Technology Inc. describes methods and apparatus for using characterized memories with a range of performances over various operational parameters. These characterized memories can be utilized in applications such as cryptocurrency mining to generate memory hard proof-of-work (POW) and validate results against general compute memories. The patent also discusses the implementation of a validation mechanism for multiple searching apparatus in parallel to enhance efficiency. Additionally, the use of characterized memories is explored in various other applications like blockchain, social media, machine learning, and error-tolerant applications.
The patent includes claims related to a memory apparatus characterized by uncorrectable fault performance and first performance under specific operating parameters. The memory apparatus stores data items identifying these performances and parameters, with error correction logic categorizing data faults as probabilistic errors or hardware failures. The patent also covers computerized logic for assessing memory device performance, determining fault correctability, and methods for assessing memory apparatus performance under different conditions and operational parameters. The determination of solution density functions for applications and the consideration of noise floors and information sparsity are also discussed in the patent claims.
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