National Instruments has patented a method and system for sorting electronic devices during testing. The technology involves receiving data from a test tool, determining provisional binning, applying algorithms to define permanent binning, and sorting devices accordingly. GlobalData’s report on National Instruments gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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According to GlobalData’s company profile on National Instruments, Digital twins was a key innovation area identified from patents. National Instruments's grant share as of February 2024 was 90%. Grant share is based on the ratio of number of grants to total number of patents.
System for sorting electronic devices based on test data
A recently granted patent (Publication Number: US11919046B2) discloses a system and method for sorting electronic devices based on test data generated during a test operation. The system includes memory to store provisional binning assignments and an evaluator to define permanent binning assignments using different algorithms. These permanent assignments determine the final placement of the electronic device in specific bins after the test operation is completed. The algorithms used include static and dynamic part average testing algorithms, with the second algorithm incorporating data from previously tested devices. The system aims to efficiently categorize electronic devices based on their test results for streamlined sorting processes.
Furthermore, the patent also covers a non-transitory computer program product that facilitates the sorting of electronic devices based on test data analysis. The program allows for the reception of provisional binning assignments and the application of different algorithms to determine permanent binning assignments. By updating the instruction set on the test tool, the program ensures that electronic devices are accurately placed in the appropriate bins post-testing. Additionally, the second algorithm leverages data from prior device tests to enhance the accuracy of the sorting process. Overall, the patented system and method offer a comprehensive approach to sorting electronic devices based on test data analysis, aiming to improve efficiency and accuracy in the sorting process.
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