NEC. has developed a patent for an inspection assistance device that suggests testing regions for genetic testing of somatic cells. The device acquires image data of a pathology specimen, estimates tumor cell content rates, determines test regions, and outputs information on the regions. GlobalData’s report on NEC gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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According to GlobalData’s company profile on NEC, Battery management systems was a key innovation area identified from patents. NEC's grant share as of January 2024 was 23%. Grant share is based on the ratio of number of grants to total number of patents.
Genetic testing assistance device for tumor cell content estimation
The patent application (Publication Number: US20240037736A1) describes an inspection assistance device that utilizes image data of a pathology specimen to estimate the tumor cell content rate in different regions of interest. The device includes a memory to store instructions and a processor to execute these instructions. The processor acquires image data, estimates tumor cell content rates, determines test regions based on specific conditions related to tumor cell content rates, and outputs information indicating the test region. Additionally, the device can display tumor cell content rates on the image and utilize a neural network trained on a tumor model to estimate these rates.
Furthermore, the patent application also covers an inspection assistance method and a non-transitory recording medium recording a program for executing the steps of acquiring image data, estimating tumor cell content rates, determining test regions, and outputting relevant information. The method and program aim to assist in the analysis of pathology specimens by providing accurate tumor cell content rate estimations and identifying specific test regions within the regions of interest. By utilizing advanced technology and specific conditions related to tumor cell content rates, the inspection assistance device and method described in the patent application offer a comprehensive solution for efficient and effective pathology specimen analysis.
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