Advantest has been granted a patent for a measurement apparatus that includes a signal source generating a multi-tone waveform, a waveform acquisition unit for capturing analog signals, and a computation unit to analyze frequency characteristics of a device under test, determining its quality based on these characteristics. GlobalData’s report on Advantest gives a 360-degree view of the company including its patenting strategy. Buy the report here.
Smarter leaders trust GlobalData
Access deeper industry intelligence
Experience unmatched clarity with a single platform that combines unique data, AI, and human expertise.
According to GlobalData’s company profile on Advantest, NFC-enabled implants was a key innovation area identified from patents. Advantest's grant share as of July 2024 was 51%. Grant share is based on the ratio of number of grants to total number of patents.
Measurement apparatus for testing device frequency characteristics
The patent US12055570B2 describes a measurement apparatus designed to evaluate the quality of a device under test (DUT) by analyzing its frequency characteristics. The apparatus includes a signal source that generates a binary digital signal to create a multi-tone waveform. This signal is applied to the DUT, and an analog signal waveform is acquired through a waveform acquisition unit. A computation unit then calculates the frequency characteristics from the acquired waveform, while a determination unit assesses the DUT's quality. If the calculated frequency characteristic falls outside a predefined reference range, the DUT is classified as faulty. The signal source employs a method of upconversion using a pseudo-random binary sequence (PRBS) signal combined with a repeating rectangular wave.
Additionally, the apparatus may include a low-pass filter positioned between the signal source and the DUT, as well as a reference resistor connected in series with the DUT. The waveform acquisition unit is capable of capturing the analog signal waveform at various measurement points, ensuring accurate data collection. The design allows for multiple probes to be connected to different DUTs, facilitating simultaneous testing. The patent also outlines a measurement method that mirrors the apparatus's functionality, detailing the steps of signal output, waveform acquisition, frequency characteristic calculation, and quality determination. Furthermore, a non-transitory computer-readable medium is described, which contains a program enabling a computer to perform the functions of the measurement apparatus. This innovation is particularly relevant for applications involving MEMS devices, enhancing the efficiency and accuracy of quality assessments in electronic testing.
To know more about GlobalData’s detailed insights on Advantest, buy the report here.
Data Insights
From
The gold standard of business intelligence.
Blending expert knowledge with cutting-edge technology, GlobalData’s unrivalled proprietary data will enable you to decode what’s happening in your market. You can make better informed decisions and gain a future-proof advantage over your competitors.
GlobalData, the leading provider of industry intelligence, provided the underlying data, research, and analysis used to produce this article.
GlobalData Patent Analytics tracks bibliographic data, legal events data, point in time patent ownerships, and backward and forward citations from global patenting offices. Textual analysis and official patent classifications are used to group patents into key thematic areas and link them to specific companies across the world’s largest industries.
