KLA had two patents in big data during Q2 2024. The patent filed by KLA Corp in Q2 2024 discloses a method for defect mitigation in semiconductor manufacturing. The method involves receiving defect data for samples, identifying disqualifying defects based on predetermined thresholds, generating a tool readable index to adjust downstream fabrication steps, and providing the index to downstream fabrication tools for necessary adjustments. GlobalData’s report on KLA gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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KLA had no grants in big data as a theme in Q2 2024.
Recent Patents
Application: System and method for defect mitigation using data analysis (Patent ID: US20240142958A1)
The patent filed by KLA Corp describes a method for defect mitigation in manufacturing processes. The method involves receiving defect data for defects in samples, identifying disqualifying defects based on predetermined thresholds, generating a tool-readable index to adjust downstream fabrication steps, and providing this index to downstream fabrication tools. The system includes a characterization sub-system for defect inspection, controllers to process defect data, and downstream fabrication tools like photolithography and etching tools.
The system and method outlined in the patent aim to improve manufacturing processes by efficiently identifying and addressing defects in samples. By utilizing defect data and predetermined thresholds, disqualifying defects can be pinpointed and downstream fabrication steps adjusted accordingly. The tool-readable index generated serves as a guide for downstream fabrication tools to make necessary adjustments, ultimately enhancing the quality and efficiency of the manufacturing process, particularly in the production of printed circuit boards. The patent emphasizes the importance of user-defined thresholds in defect identification and mitigation, highlighting the customizable nature of the system to suit specific manufacturing requirements.
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GlobalData Patent Analytics tracks bibliographic data, legal events data, point in time patent ownerships, and backward and forward citations from global patenting offices. Textual analysis and official patent classifications are used to group patents into key thematic areas and link them to specific companies across the world’s largest industries.
